Matthias Kampmann und Sybille Hellebrand haben erfolgreich den Beitrag Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test beim IEEE "Workshop on RTL and High-Level Testing" (WRTLT) eingereicht. Matthias Kampmann wird im Oktober den Vortrag in China halten.
Abstract:
Hidden small delay defects hint to early life failures, which are reliability threats. Detection of these defects is possible with Faster–than–at-Speed Test (FAST), however, FAST is challenging for test response compaction as it results in high and varying rates of unknown logic values. Therefore, the Design-for-FAST approach supports X-tolerant compaction by designing scan-chains specifically tailored to FAST, such that large numbers of X-values are clustered in only few scan-chains. Yet, while the state-of-the-art SFF clustering approach provides efficient X-masking capabilities, the fault efficiency might be compromised in extreme cases, as it does not pay respect to fault information.
Therefore, this paper presents a new SFF clustering technique based on simulated annealing, including an enhanced X-profile calculation. Results indicate, that the proposed method provides better fault efficiency than previous clustering approaches at comparable or even superior X-reduction capabilities.