Konferenzbeiträge
Liste im Research Information System öffnen
A. Sprenger, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, in: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020, 2020
S. Sadeghi-Kohan, S. Hellebrand, in: 38th IEEE VLSI Test Symposium (VTS), IEEE, 2020
S. Holst, M. Kampmann, A. Sprenger, J.D. Reimer, S. Hellebrand, H. Wunderlich, X. Weng, in: IEEE International Test Conference (ITC'20), November 2020, 2020
M.U. Maaz, A. Sprenger, S. Hellebrand, in: 50th IEEE International Test Conference (ITC), IEEE, 2019, pp. 1-8
R. Rezaeizadeh Rookerd, S. Sadeghi-Kohan, Z. Navabi, in: Proceedings of the 2018 on Great Lakes Symposium on VLSI, ACM, 2018
S. Sadeghi-Kohan, A. Vafaei, Z. Navabi, in: 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS), IEEE, 2018
A. Sprenger, S. Hellebrand, in: 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), IEEE, 2018
C. Liu, E. Schneider, M. Kampmann, S. Hellebrand, H. Wunderlich, in: 27th IEEE Asian Test Symposium (ATS'18), 2018
J. Deshmukh, W. Kunz, H. Wunderlich, S. Hellebrand, in: 35th IEEE VLSI Test Symposium (VTS'17), IEEE, 2017
M. Jenihhin, A. Kamkin, Z. Navabi, S. Sadeghi-Kohan, in: 2016 IEEE East-West Design & Test Symposium (EWDTS), IEEE, 2017
M. Kampmann, S. Hellebrand, in: 20th IEEE International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS'17), IEEE, 2017
M. Kampmann, S. Hellebrand, in: 25th IEEE Asian Test Symposium (ATS'16), IEEE, 2016, pp. 1-6
M. Kampmann, M. A. Kochte, E. Schneider, T. Indlekofer, S. Hellebrand, H. Wunderlich, in: 24th IEEE Asian Test Symposium (ATS'15), IEEE, 2015, pp. 109-114
S. Sadeghi-Kohan, A. Kamran, F. Forooghifar, Z. Navabi, in: 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), IEEE, 2015
S. Sadeghi-Kohan, M. Kamal, J. McNeil, P. Prinetto, Z. Navabi, in: 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), IEEE, 2015
S. Hellebrand, T. Indlekofer, M. Kampmann, M. A. Kochte, C. Liu, H. Wunderlich, in: IEEE International Test Conference (ITC'14), IEEE, 2014
S. Hellebrand, in: 14th IEEE Latin American Test Workshop - (LATW'13), IEEE, 2013
A. Cook, S. Hellebrand, M. E. Imhof, A. Mumtaz, H. Wunderlich, in: 13th IEEE Latin American Test Workshop (LATW'12), IEEE, 2012, pp. 1-4
A. Cook, S. Hellebrand, H. Wunderlich, in: 17th IEEE European Test Symposium (ETS'12), IEEE, 2012, pp. 1-6
A. Cook, S. Hellebrand, T. Indlekofer, H. Wunderlich, in: 20th IEEE Asian Test Symposium (ATS'11), IEEE, 2011, pp. 285-290
I. Polian, B. Becker, S. Hellebrand, H. Wunderlich, P. Maxwell, in: 16th IEEE European Test Symposium Trondheim (ETS'11), IEEE, 2011
A. Cook, S. Hellebrand, T. Indlekofer, H. Wunderlich, in: 5. GMM/GI/ITG Fachtagung "Zuverlässigkeit und Entwurf", 2011, pp. 48-53
B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H. Wunderlich, in: 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W'10), IEEE, 2010
M. Hunger, S. Hellebrand, in: 4. GMM/GI/ITG-Fachtagung "Zuverlässigkeit und Entwurf", 2010, pp. 81-88
F. Hopsch, B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H. Wunderlich, in: 19th IEEE Asian Test Symposium (ATS'10), IEEE, 2010, pp. 87-93
T. Indlekofer, M. Schnittger, S. Hellebrand, in: 28th IEEE International Conference on Computer Design (ICCD'10), IEEE, 2010, pp. 480-485
M. Hunger, S. Hellebrand, in: 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'10), IEEE, 2010, pp. 101-108
V. Froese, R. Ibers, S. Hellebrand, in: 28th IEEE VLSI Test Symposium (VTS'10), IEEE, 2010, pp. 227-231
B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H. Wunderlich, in: 4th Workshop on Dependable and Secure Nanocomputing (WDSN'10), (Invited Paper), 2010
T. Indlekofer, M. Schnittger, S. Hellebrand, in: 4. GMM/GI/ITG-Fachtagung "Zuverlässigkeit und Entwurf", 2010, pp. 17-24
M. Hunger, S. Hellebrand, A. Czutro, I. Polian, B. Becker, in: 15th IEEE International On-Line Testing Symposium (IOLTS'09, IEEE, 2009
S. Hellebrand, M. Hunger, in: 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'09), (Invited Talk), IEEE, 2009, pp. 77
M. Hunger, S. Hellebrand, A. Czutro, I. Polian, B. Becker, in: 3. GMM/GI/ITG-Fachtagung "Zuverlässigkeit und Entwurf", 2009
P. Oehler, A. Bosio, G. di Natale, S. Hellebrand, in: 14th IEEE International On-Line Testing Symposium (IOLTS'08), (Poster), IEEE, 2008
U. Amgalan, C. Hachmann, S. Hellebrand, H. Wunderlich, in: 26th IEEE VLSI Test Symposium (VTS'08), IEEE, 2008, pp. 125-130
M. Hunger, S. Hellebrand, in: 14th IEEE International On-Line Testing Symposium (IOLTS'08), IEEE, 2008
M. Hunger, S. Hellebrand, in: 2. GMM/GI/ITG-Fachtagung "Zuverlässigkeit und Entwurf", 2008
P. Oehler, A. Bosio, G. Di Natale, S. Hellebrand, in: 2. GMM/GI/ITG-Fachtagung "Zuverlässigkeit und Entwurf", 2008
S. Hellebrand, C. G. Zoellin, H. Wunderlich, S. Ludwig, T. Coym, B. Straube, in: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT'07), IEEE, 2007, pp. 50-58
P. Oehler, S. Hellebrand, H. Wunderlich, in: 10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS'07), IEEE, 2007, pp. 185-190
P. Oehler, S. Hellebrand, H. Wunderlich, in: 12th IEEE European Test Symposium (ETS'07), IEEE, 2007, pp. 91-96
S. Hellebrand, C. G. Zoellin, H. Wunderlich, S. Ludwig, T. Coym, B. Straube, in: 43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM'07), (Invited Paper), 2007
M. Ali, M. Welzl, S. Hessler, S. Hellebrand, in: 4th International Conference on Information Technology: New Generations (ITNG'07), 2007, pp. 1027-1032
B. Becker, I. Polian, S. Hellebrand, B. Straube, H. Wunderlich, in: 1. GMM/GI/ITG-Fachtagung "Zuverlässigkeit und Entwurf", 2007
M. Ali, M. Welzl, M. Zwicknagl, S. Hellebrand, in: IEEE International Conference on Microelectronics (ICM'05), IEEE, 2005
P. Oehler, S. Hellebrand, in: 10th IEEE European Test Symposium (ETS'05), IEEE, 2005, pp. 148-153
M. Ali, M. Welzl, S. Hellebrand, in: 23rd IEEE NORCHIP Conference, IEEE, 2005, pp. 70-73
M. Liu Jing, S. Ruehrup, C. Schindelhauer, K. Volbert, M. Dierkes, A. Bellgardt, R. Ibers, U. Hilleringmann, in: {GOR/NGB Conference Tilburg 2004}, 2004
A. Wuertenberger, C. S. Tautermann, S. Hellebrand, in: IEEE International Test Conference (ITC'04), IEEE, 2004, pp. 926-935
A. Wuertenberger, C. S. Tautermann, S. Hellebrand, in: IEEE International Test Conference (ITC'03), IEEE, 2003, pp. 451-459
H. Liang, S. Hellebrand, H. Wunderlich, in: IEEE International Test Conference (ITC'01), IEEE, 2001, pp. 894-902
S. Hellebrand, H. Liang, H. Wunderlich, in: IEEE International Test Conference (ITC'00), IEEE, 2000, pp. 778-784
S. Hellebrand, H. Wunderlich, A. A. Ivaniuk, Y. V. Klimets, V. N. Yarmolik, in: 17th IEEE VLSI Test Symposium (VTS'99), IEEE, 1999, pp. 384-390
V. N. Yarmolik, I. V. Bykov, S. Hellebrand, H. Wunderlich, in: Third European Dependable Computing Conference (EDCC-3), 1999
S. Hellebrand, H. Wunderlich, V. N. Yarmolik, in: Design Automation and Test in Europe (DATE'99), 1999, pp. 702-707
A. Hertwig, S. Hellebrand, H. Wunderlich, in: 16th IEEE VLSI Test Symposium (VTS'98), IEEE, 1998, pp. 296-302
S. Hellebrand, H. Wunderlich, V. N. Yarmolik, in: Design Automation and Test in Europe (DATE'98), 1998, pp. 173-179
V. N. Yarmolik, Y. V. Klimets, S. Hellebrand, H. Wunderlich, in: Design & Diagnostics of Electronic Circuits & Systems (DDECS'98), 1998, pp. 27-33
K. Tsai, S. Hellebrand, M. Marek-Sadowska, J. Rajski, in: 34th ACM/IEEE Design Automation Conference (DAC'97), IEEE, 1997
S. Hellebrand, H. Wunderlich, A. Hertwig, in: IEEE International Test Conference (ITC'96), IEEE, 1996, pp. 195-204
S. Hellebrand, B. Reeb, S. Tarnick, H. Wunderlich, in: ACM/IEEE International Conference on Computer Aided Design (ICCAD'95), IEEE, 1995, pp. 88-94
S. Hellebrand, H. Wunderlich, in: ACM/IEEE International Conference on Computer-Aided Design (ICCAD'94), IEEE, 1994, pp. 110-116
S. Hellebrand, H. Wunderlich, in: Tagungsband der GI/GME/ITG-Fachtagung \& Rechnergestützter Entwurf und Architektur mikroelektronischer Systeme, 1994, pp. 3-11
S. Hellebrand, H. Wunderlich, in: European Design and Test Conference (EDAC/ETC/EUROASIC), 1994, pp. 580-585
S. Venkataraman, J. Rajski, S. Hellebrand, S. Tarnick, in: ACM/IEEE International Conference on Computer Aided Design (ICCAD'93), IEEE, 1993
S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, in: IEEE International Test Conference (ITC'92), IEEE, 1992, pp. 120-129
S. Hellebrand, H. Wunderlich, in: European Design Automation Conference (EDAC'90), IEEE, 1990, pp. 13-17
S. Hellebrand, H. Wunderlich, O. F. Haberl, in: IEEE International Test Conference (ITC'90), IEEE, 1990, pp. 670-679
H. Wunderlich, S. Hellebrand, in: IEEE International Test Conference (ITC'89), IEEE, 1989, pp. 19-27
H. Wunderlich, S. Hellebrand, in: 18th International Symposium on Fault-Tolerant Computing, FTCS-18, 1988, pp. 36-45
D. Schmid, H. Wunderlich, F. Feldbusch, S. Hellebrand, J. Holzinger, A. Kunzmann, in: Tool Integration and Design Environments, F.J. Rammig (Editor), Amsterdam: Elsevier Science Publishers B.V.(North Holland), IFIP, 1988, pp. 233-258
S. Hellebrand, H. Wunderlich, in: GI - 18. Jahrestagung II, Hamburg, 1988, Informatik-Fachberichte 188, Springer Verlag, 1988, pp. 145-159