Jour­n­al Pa­pers

Workload-Aware Periodic Interconnect BIST

S. Sadeghi-Kohan, S. Hellebrand, H.-J. Wunderlich, IEEE Design &Test (2023) 1–1.


Stress-Aware Periodic Test of Interconnects

S. Sadeghi-Kohan, S. Hellebrand, H.-J. Wunderlich, Journal of Electronic Testing (2022).


Divide and Compact - Stochastic Space Compaction for Faster-than-At-Speed Test

A. Sprenger, S. Hellebrand, Journal of Circuits, Systems and Computers 28 (2019) 1–23.


Built-in Test for Hidden Delay Faults

M. Kampmann, M. A. Kochte, C. Liu, E. Schneider, S. Hellebrand, H.-J. Wunderlich, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) 38 (2019) 1956–1968.


Guest Editors' Introduction - Special Issue on Approximate Computing

S. Hellebrand, J. Henkel, A. Raghunathan, H.-J. Wunderlich, IEEE Embedded Systems Letters 10 (2018) 1–1.


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Books and Chap­ters

Selbsttestbare Steuerwerke - Strukturen und Syntheseverfahren

S. Hellebrand, Selbsttestbare Steuerwerke - Strukturen Und Syntheseverfahren, Verlag Dr. Kovac, Hamburg, Verlag Dr. Kovac, Hamburg, 1999.


Mixed-Mode BIST Using Embedded Processors

S. Hellebrand, H.-J. Wunderlich, A. Hertwig, in: Mixed-Mode BIST Using Embedded Processors, Kluwer Academic Publishers, In: M. Nicolaidis, Y. Zorian, D. K. Pradhan (Eds.): On-Line Testing for VLSI, Boston: Kluwer Academic Publishers 1998, 1998.


Synthese vollständig testbarer Schaltungen

S. Hellebrand, Synthese Vollständig Testbarer Schaltungen, Verlag Düsseldorf: VDI Verlag, Verlag Düsseldorf: VDI Verlag, 1991.


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