VLSI Testing

Description

The course "VLSI Testing" focuses on techniques for detecting hardware defects in micro-electronic circuits. Algorithms for test data generation and test response evaluation as well as hardware structures for design for test (DFT) and on-chip test implementation (BIST) are presented.

Content

• Fault models
• Testability measures and design for test (DFT)
• Logic and fault simulation
• Automatic test pattern generation (ATPG)
• Built-in self-test (BIST), in particular test data compression and test response compaction
• Memory test
• ...

Literature

• Michael L. Bushnell, Vishwani D. Agrawal: „Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits“, Boston, Dordrecht, London: Kluwer Academic Publishers, 2000
• Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen: „VLSI Test Principles and Architectures: Design for Testability“, Morgan Kaufmann Series in Systems on Silicon, ISBN: 0123705975

Exam

oral exam, appointment upon agreement

Requirements

• Digital Design

Module group

Computer Engineering (Master):

• Compulsory elective module: VLSI Testing
• Specialization: Embedded Systems, Nano/Microelectronics

Elektrotechnik (Master):

• Mikroelektronik

Informatik (Master):

• Compulsory elective module: VLSI Testing

Electrical Systems Engineering (Master):

• Electronics and Devices

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