Matthias Kampmann and Sybille Hellebrand got their submission "Design for Small Delay Test - A Simulation Study" to the journal "Microelectronics Reliability", published by Elsevier, accepted. In their submission, the authors further analyze the proposed "Design-for-FAST" architecture, which they previously published in the award-winning paper "Design-for-FAST: Supporting X-tolerant Compaction during Faster-than-at-Speed Test". They integrated the approach into an industrial synthesis workflow and performed an extensive simulation study on circuits synthesized with this approach. They show the advantages and disadvantages of "Design-for-FAST", when it is compared to a standard synthesis process.
