Dr.-Ing. Matthias Kampmann presents his current research at Siemens EDA on Thursday 11.05.2023 at 14:00h in our seminar room P1.6.17.1. The presentation is titled:
"Industrial Trends in DFT: IJTAG & SSN".
The presentation will be given in german. Everyone who is interested is welcome to attend the session.
Abstract
In this talk, some of the recent DFT developments at Siemens EDA will be presented.
The first part covers FastIJTAG, which is a solution to increase the shift speed of IJTAG operations. It comprises of both hardware and software solutions. At its core lies the selective TCK stretching feature, which will be the focus of this part. It is a pure solution designed to overcome setup and hold issues with IJTAG control signals, one of the main reasons why TCK speed is limited in large IJTAG networks.
In the second part of the talk, the Streaming Scan Network (SSN) is presented. SSN delivers test data to the cores in a large design through a parallel bus, which has several benefits: High bandwidths can be easily achieved, shortening test time, and the cores are decoupled, which reduces design effort and reduces test data volume. With techniques like on-chip compare testing, a chip can be tested very effectively. This part covers the basics of SSN: An Introduction to the technology as well as some advanced nodes that can be placed on the bus to ease timing closure of the design.