The paper "Logic Fault Diagnosis of Hidden Delay Defects" from Stefan Holst, Matthias Kampmann, Alexander Sprenger, Jan Dennis Reimer, Sybille Hellebrand, Hans-Joachim Wunderlich and Xiaoqing Wen was accepted as a conference paper at the IEEE International Test Conference. The paper is a result of a cooperation with the Kyushu Institute of Technology and the University of Paderborn.
The conference will take place from November 3rd till November 5th 2020.