We are pleased to announce that our paper entitled "On Cryptography Effects on Interconnect Reliability" has been accepted at the Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen" (TuZ'2023). The authors of the paper are Abdulkarim Ghazal, Somayeh Sadeghi-Kohan, Jan Dennis Reimer, and Sybille Hellebrand. We look forward to presenting our research at TuZ'2023 and sharing our findings with the community.
The workshop will be held in Nordhausen (Germany) from February 26-28, 2023.