The paper "Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects" from Somayeh Sadeghi-Kohan and Sybille Hellebrand was accepted for the IEEE VLSI Test Symposium (VTS2020). It takes place from April, 4th to April 8th in San Diego, USA.
The paper "Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects" from Somayeh Sadeghi-Kohan and Sybille Hellebrand was accepted for the IEEE VLSI Test Symposium (VTS2020). It takes place from April, 4th to April 8th in San Diego, USA.