Prof. Dr. Sybille Hellebrand
Leiterin - Professorin
nach Vereinbarung
33098 Paderborn
| 07/1986 - heute | Curriculum Vitae Sybille Hellebrand received her Diploma in Mathematics from the University of Regensburg in 1986. In the same year she joined the Institute of Computer Design and Fault Tolerance at the University of Karlsruhe, where she finished her Ph.D. in Computer Science in 1991. From 1991 to 1992 she received a post-doctoral fellowship from the French government and continued her research work at the TIM3/IMAG Laboratory in Grenoble, France. In 1992 she joined the University of Siegen as a post-doctoral research and teaching assistant. For her habilitation project she received a Lise- Meitner Fellowship from the NRW government in 1995. Before she completed her habilitation in 1997 she spent several months as a guest researcher at Mentor Graphics Corporation in Portland, OR, USA. After her stay in the USA, Sybille Hellebrand moved to the University of Stuttgart as a permanent research and teaching assistant. In 1999 she was appointed full professor in Computer Science at the University of Innsbruck, Austria. Since December 2004 she holds the chair for Computer Engineering at the Institute of Electrical Engineering and Information Technology at the University of Paderborn. Sybille Hellebrand is a member of the Institute of Electrical and Electronics Engineers (IEEE) and the IEEE Test Technology Technical Council (TTTC). She has served on the program committees of many international conferences, and she was the General Chair of the IEEE European Test Symposium in 2014. She is an associate editor of the Journal of Electronic Testing – Theory and Applications (JETTA). From 2002 to 2009 she was a member of the editorial board of IEEE Transactions on Computer-Aided Design of Circuits and Systems. Her main research interests are in test, diagnosis, and fault tolerance of integrated circuits and systems. |
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2020
A. Sprenger, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, in: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020, 2020
S. Sadeghi-Kohan, S. Hellebrand, in: Proceedings IEEE VLSI Test Symposium, IEEE, 2020, pp. 1-6
S. Holst, M. Kampmann, A. Sprenger, J.D. Reimer, S. Hellebrand, H. Wunderlich, X. Weng, in: IEEE International Test Conference (ITC'20), November 2020, 2020
2019
M.U. Maaz, A. Sprenger, S. Hellebrand, 31. Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen" (TuZ'19), 2019
A. Sprenger, S. Hellebrand, Journal of Circuits, Systems and Computers (2019), 28(1), pp. 1-23
M.U. Maaz, A. Sprenger, S. Hellebrand, in: 50th IEEE International Test Conference (ITC), IEEE, 2019, pp. 1-8
M. Kampmann, M. A. Kochte, C. Liu, E. Schneider, S. Hellebrand, H. Wunderlich, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) (2019), 38(10), pp. 1956 - 1968
2018
A. Sprenger, S. Hellebrand, 30. Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen" (TuZ'18), 2018
M. Kampmann, S. Hellebrand, Microelectronics Reliability (2018), 80, pp. 124-133
S. Hellebrand, J. Henkel, A. Raghunathan, H. Wunderlich, IEEE Embedded Systems Letters (2018), 10(1), pp. 1-1
C. Liu, E. Schneider, M. Kampmann, S. Hellebrand, H. Wunderlich, in: 2018 IEEE 27th Asian Test Symposium (ATS), 2018
A. Sprenger, S. Hellebrand, in: 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), IEEE, 2018
2017
M. Kampmann, S. Hellebrand, in: 2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), IEEE, 2017
J. Deshmukh, W. Kunz, H. Wunderlich, S. Hellebrand, in: 35th IEEE VLSI Test Symposium (VTS'17), IEEE, 2017
M. Kampmann, S. Hellebrand, 2017
2016
M. Kampmann, S. Hellebrand, in: 25th IEEE Asian Test Symposium (ATS'16), IEEE, 2016, pp. 1-6
2015
M. Kampmann, M. A. Kochte, E. Schneider, T. Indlekofer, S. Hellebrand, H. Wunderlich, in: 24th IEEE Asian Test Symposium (ATS'15), IEEE, 2015, pp. 109-114
Z. Huang, H. Liang, S. Hellebrand, Journal of Electronic Testing - Theory and Applications (JETTA) (2015), 31(4), pp. 349-359
S. Hellebrand, T. Indlekofer, M. Kampmann, M. Kochte, C. Liu, H. Wunderlich, 2015
2014
S. Hellebrand, T. Indlekofer, M. Kampmann, M. A. Kochte, C. Liu, H. Wunderlich, in: IEEE International Test Conference (ITC'14), IEEE, 2014
S. Hellebrand, H. Wunderlich, DeGruyter Journal on Information Technology (it) (2014), 56(4), pp. 165-172
L. Rodriguez Gomez, A. Cook, T. Indlekofer, S. Hellebrand, H. Wunderlich, Journal of Electronic Testing - Theory and Applications (JETTA) (2014), 30(5), pp. 527-540
2013
A. Cook, L. Rodriguez Gomez, S. Hellebrand, T. Indlekofer, H. Wunderlich, 2013
S. Hellebrand, in: 14th IEEE Latin American Test Workshop - (LATW'13), IEEE, 2013
2012
A. Cook, S. Hellebrand, M. E. Imhof, A. Mumtaz, H. Wunderlich, in: 13th IEEE Latin American Test Workshop (LATW'12), IEEE, 2012, pp. 1-4
A. Cook, S. Hellebrand, H. Wunderlich, in: 17th IEEE European Test Symposium (ETS'12), IEEE, 2012, pp. 1-6
A. Cook, S. Hellebrand, H. Wunderlich, 2012
2011
I. Polian, B. Becker, S. Hellebrand, H. Wunderlich, P. Maxwell, in: 16th IEEE European Test Symposium Trondheim (ETS'11), IEEE, 2011
F. Hopsch, B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H. Wunderlich, {SCIENCE CHINA Information Sciences, Science China Press, co-published with Springer} (2011), 54(4), pp. 1813-1826
A. Cook, S. Hellebrand, T. Indlekofer, H. Wunderlich, in: 5. GMM/GI/ITG Fachtagung "Zuverlässigkeit und Entwurf", 2011, pp. 48-53
A. Cook, S. Hellebrand, T. Indlekofer, H. Wunderlich, in: 20th IEEE Asian Test Symposium (ATS'11), IEEE, 2011, pp. 285-290
2010
F. Hopsch, B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H. Wunderlich, in: {19th IEEE Asian Test Symposium (ATS'10)}, {IEEE}, 2010, pp. 87-93
V. Froese, R. Ibers, S. Hellebrand, in: {28th IEEE VLSI Test Symposium (VTS'10)}, {IEEE}, 2010, pp. 227-231
B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H. Wunderlich, in: {4th Workshop on Dependable and Secure Nanocomputing (WDSN'10), (Invited Paper)}, 2010
M. Hunger, S. Hellebrand, in: 4. GMM/GI/ITG-Fachtagung "Zuverlässigkeit und Entwurf", 2010, pp. 81-88
T. Indlekofer, M. Schnittger, S. Hellebrand, in: {28th IEEE International Conference on Computer Design (ICCD'10)}, {IEEE}, 2010, pp. 480-485
V. Fröse, R. Ibers, S. Hellebrand, 2010
M. Hunger, S. Hellebrand, in: {25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'10)}, {IEEE}, 2010, pp. 101-108
S. Hellebrand, 2010
B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H. Wunderlich, in: 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W'10), IEEE, 2010
T. Indlekofer, M. Schnittger, S. Hellebrand, in: {4. GMM/GI/ITG-Fachtagung "Zuverlässigkeit und Entwurf"}, 2010, pp. 17-24
2009
S. Hellebrand, M. Hunger, in: {24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'09), (Invited Talk)}, {IEEE}, 2009, pp. 77
M. Hunger, S. Hellebrand, A. Czutro, I. Polian, B. Becker, in: {15th IEEE International On-Line Testing Symposium (IOLTS'09)}, {IEEE}, 2009
M. Hunger, S. Hellebrand, A. Czutro, I. Polian, B. Becker, in: {3. GMM/GI/ITG-Fachtagung "Zuverlässigkeit und Entwurf"}, 2009
2008
P. Oehler, A. Bosio, G. Di Natale, S. Hellebrand, in: {2. GMM/GI/ITG-Fachtagung "Zuverlässigkeit und Entwurf"}, 2008
T. Coym, S. Hellebrand, S. Ludwig, B. Straube, H. Wunderlich, C. G. Zoellin, 2008
P. Oehler, A. Bosio, G. di Natale, S. Hellebrand, in: {14th IEEE International On-Line Testing Symposium (IOLTS'08), (Poster)}, {IEEE}, 2008
M. Hunger, S. Hellebrand, in: {14th IEEE International On-Line Testing Symposium (IOLTS'08)}, {IEEE}, 2008
U. Amgalan, C. Hachmann, S. Hellebrand, H. Wunderlich, 2008
U. Amgalan, C. Hachmann, S. Hellebrand, H. Wunderlich, in: {26th IEEE VLSI Test Symposium (VTS'08)}, {IEEE}, 2008, pp. 125-130
M. Hunger, S. Hellebrand, in: {2. GMM/GI/ITG-Fachtagung "Zuverlässigkeit und Entwurf"}, 2008
2007
S. Hellebrand, C. G. Zoellin, H. Wunderlich, S. Ludwig, T. Coym, B. Straube, in: {22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT'07)}, {IEEE}, 2007, pp. 50-58
S. Hellebrand, C. G. Zoellin, H. Wunderlich, S. Ludwig, T. Coym, B. Straube, in: {43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM'07), (Invited Paper)}, 2007
M. Ali, S. Hessler, M. Welzl, S. Hellebrand, {International Journal on High Performance Systems Architecture} (2007), 1(2), pp. 113-123
P. Oehler, S. Hellebrand, H. Wunderlich, in: {10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS'07)}, {IEEE}, 2007, pp. 185-190
S. Hellebrand, 2007
M. Ali, M. Welzl, S. Hessler, S. Hellebrand, in: {4th International Conference on Information Technology: New Generations (ITNG'07)}, 2007, pp. 1027-1032
M. Ali, M. Welzl, S. Hessler, S. Hellebrand, 2007
B. Becker, I. Polian, S. Hellebrand, B. Straube, H. Wunderlich, in: {1. GMM/GI/ITG-Fachtagung "Zuverlässigkeit und Entwurf"}, 2007
P. Oehler, S. Hellebrand, H. Wunderlich, in: {12th IEEE European Test Symposium (ETS'07)}, {IEEE}, 2007, pp. 91-96
P. Oehler, S. Hellebrand, H. Wunderlich, 2007
S. Hellebrand, C. G. Zoellin, H. Wunderlich, S. Ludwig, T. Coym, B. Straube, {Informacije MIDEM, Ljubljana (Invited Paper)} (2007), 37(4 (124)), pp. 212-219
S. Hellebrand, 2007
2006
B. Becker, I. Polian, S. Hellebrand, B. Straube, H. Wunderlich, {it -Information Technology} (2006), 48(5), pp. 305-311
2005
P. Oehler, S. Hellebrand, 2005
M. Ali, M. Welzl, S. Hellebrand, in: {23rd IEEE NORCHIP Conference}, {IEEE}, 2005, pp. 70-73
M. Ali, M. Welzl, M. Zwicknagl, S. Hellebrand, in: {IEEE International Conference on Microelectronics (ICM'05)}, {IEEE}, 2005
P. Oehler, S. Hellebrand, in: {10th IEEE European Test Symposium (ETS'05)}, {IEEE}, 2005, pp. 148-153
M. Ali, M. Welzl, S. Hellebrand, 2005
2004
A. Wuertenberger, C. S. Tautermann, S. Hellebrand, in: {IEEE International Test Conference (ITC'04)}, {IEEE}, 2004, pp. 926-935
R. Breu, T. Fahringer, D. Fensel, S. Hellebrand, A. Middeldorp, O. Scherzer, 2004
S. Hellebrand, A. Wuertenberger, C. S. Tautermann, 2004
2003
A. Wuertenberger, C. S. Tautermann, S. Hellebrand, in: {IEEE International Test Conference (ITC'03)}, {IEEE}, 2003, pp. 451-459
R. Breu, S. Hellebrand, M. Welzl, 2003
2002
H. Liang, S. Hellebrand, H. Wunderlich, {Journal on Computer Science and Technology} (2002), 17(2), pp. 203-212
S. Hellebrand, H. Liang, H. Wunderlich, {Journal of Electronic Testing - Theory and Applications (JETTA)} (2002), 18(2), pp. 157-168
S. Hellebrand, H. Wunderlich, A. A. Ivaniuk, Y. V. Klimets, V. N. Yarmolik, {IEEE Transactions on Computers} (2002), 51(7), pp. 801-809
S. Hellebrand, A. Wuertenberger, 2002
2001
S. Hellebrand, H. Liang, H. Wunderlich, {Journal of Electronic Testing - Theory and Applications (JETTA)} (2001), 17(3/4), pp. 341-349
H. Liang, S. Hellebrand, H. Wunderlich, 2001
H. Liang, S. Hellebrand, H. Wunderlich, in: {IEEE International Test Conference (ITC'01)}, {IEEE}, 2001, pp. 894-902
H. Liang, S. Hellebrand, H. Wunderlich, {Journal of Computer Research and Development, (Jisuanji Yanjiu yu Fazhan)} (2001), 38(8), pp. 931
2000
S. Hellebrand, H. Wunderlich, 2000
S. Hellebrand, H. Liang, H. Wunderlich, 2000
S. Hellebrand, H. Liang, H. Wunderlich, in: {IEEE International Test Conference (ITC'00)}, {IEEE}, 2000, pp. 778-784
1999
S. Hellebrand, H. Wunderlich, A. A. Ivaniuk, Y. V. Klimets, V. N. Yarmolik, in: {17th IEEE VLSI Test Symposium (VTS'99)}, {IEEE (Comput. Soc.)}, 1999, pp. 384-390
S. Hellebrand, Verlag Dr. Kovac, Hamburg, 1999
V. N. Yarmolik, I. V. Bykov, S. Hellebrand, H. Wunderlich, in: {Third European Dependable Computing Conference (EDCC-3)}, 1999
S. Hellebrand, H. Wunderlich, V. N. Yarmolik, in: {Design, Automation and Test in Europe (DATE'99)}, 1999, pp. 702-707
S. Hellebrand, H. Wunderlich, V. N. Yarmolik, 1999
1998
V. N. Yarmolik, Y. V. Klimets, S. Hellebrand, H. Wunderlich, in: {Design \& Diagnostics of Electronic Circuits \& Systems}, 1998, pp. 27-33
A. Hertwig, S. Hellebrand, H. Wunderlich, in: {16th IEEE VLSI Test Symposium (VTS'98)}, {IEEE (Comput. Soc.)}, 1998, pp. 296-302
S. Hellebrand, A. Hertwig, H. Wunderlich, {IEEE Design and Test} (1998), 15(4), pp. 36-41
S. Hellebrand, H. Wunderlich, A. Hertwig, in: Mixed-Mode BIST Using Embedded Processors, {Kluwer Academic Publishers}, 1998
V. N. Yarmolik, S. Hellebrand, H. Wunderlich, 1998
S. Hellebrand, H. Wunderlich, V. N. Yarmolik, in: {IEEE Design, Automation and Test in Europe (DATE'98)}, {IEEE (Comput.Soc)}, 1998, pp. 173-179
S. Hellebrand, H. Wunderlich, A. Hertwig, {Journal of Electronic Testing Theory and Applications - JETTA} (1998), 12(1/2), pp. 127-138
V. N. Yarmolik, S. Hellebrand, H. Wunderlich, 1998
S. Hellebrand, H. Wunderlich, 1998
1997
A. Hertwig, S. Hellebrand, H. Wunderlich, 1997
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